CVE-2024-53017

Medium

Memory corruption while handling test pattern generator IOCTL command.

qualcomm·CWE-823·Published 2025-06-03

CVSS

6.6

EPSS

0.00

KEV

Exploits

cve.orgen

70 chars

Memory corruption while handling test pattern generator IOCTL command.

NVDen

70 chars

Memory corruption while handling test pattern generator IOCTL command.

NVDes

94 chars

Corrupción de memoria durante el manejo del comando IOCTL del generador de patrones de prueba.

Version	Type	Source	Base	Exp	Impact	Vector
3.1	Primary	cve.org	6.6	—	—	CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L
3.1	Secondary	NVD	6.6	1.8	4.7	CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L