CVE-2024-45573

High

Memory corruption may occour while generating test pattern due to negative indexing of display ID.

qualcomm·CWE-823·Published 2025-02-03

CVSS

7.8

EPSS

0.00

KEV

Exploits

cve.orgen

98 chars

Memory corruption may occour while generating test pattern due to negative indexing of display ID.

NVDen

98 chars

Memory corruption may occour while generating test pattern due to negative indexing of display ID.

NVDes

121 chars

Se pueden producir daños en la memoria al generar el patrón de prueba debido a la indexación negativa del ID de pantalla.

Version	Type	Source	Base	Exp	Impact	Vector
3.1	Primary	cve.org	7.8	—	—	CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
3.1	Secondary	NVD	7.8	1.8	5.9	CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H